Various measuring instruments using optics, optical parts, and optical software were exhibited at this conference of the Korea Optical Society. 

  MeterLab is equipped with the s-Nova 850 spectrometer that can measure the wavelength band of 750 nm - 950 nm at a speed of up to 250 kHz. s-Nova-1550, a spectrometer capable of measuring wavelengths of 1490 nm - 1610 nm at a speed of up to 40 kHz, was exhibited. In addition, t-Nova-SR, a spectroreflectometer type thin film thickness (50 nm - 200 μm) measuring instrument, and Spectroscopic interferometric substrate thickness (100 μm - 4 mm) and refractive index simultaneous measuring instrument t-Nova-SDI Visitors were able to directly experience Meter Lab's products by putting in specimens of various thicknesses.

    Meter Lab will continue to be a company that develops together by communicating with customers through participation in many events. thank you