From Wednesday, October 4 to Friday, October 6, our parent company Novitec participated in the Photonix section of the Highly-functional Material Week at Makuhari Messe in Tokyo, Japan. As shown in Figure 1, the booth displayed products developed by Meterlab, and Meterlab's R&D staff also participated. In particular, at this exhibition, the t-Nova-850H, which can measure three-dimensional geometry with only one axial scanning by configuring an interferometer with the s-Nova-850H, a hyperspectral imaging spectrometer developed last year, was introduced for the first time. On the left side of the booth, we briefly introduced our products and technologies in Japanese, and on the right side, we explained the basic principles of thickness measurement.

Figure 1. Booth view 

Figure 2. Product introduction banner

As shown in Figure 2, the four product lines of spectrometers, thickness and shape gauges were introduced at the front. From left to right, the banners are for the t-Nova-H three-dimensional surface shape measuring instrument, the s-Nova-H hyperspectral imaging spectrometer, the t-Nova thickness and refractive index measurement sensor, and the s-Nova high-speed spectrometer.

Figure 3. t-Nova-850H and s-Nova spectrometers on the product introduction table.

As shown in Figure 3, the t-Nova-850H was on display at the product introduction table, providing a real-time demonstration of surface topography measurement of a single-step standard certified material. The s-Nova-850H, which was introduced last year, was used to measure the thickness of an entire area of film or glass as a line, and a video demonstration of the t-Nova series thickness and refractive index measurement was shown. Finally, the s-Nova series of high-speed spectrometers were on display so that customers could see the products in action.

Figure 4. Customer consultation

Many customers were very interested in the t-Nova-H three-dimensional shape measuring machine and the s-Nova series of high-speed spectrometers, as well as the t-Nova series of thickness and refractive index measuring machines. In 2024, we will participate in FilmTech and operate a booth.