Novitec, the parent company of Meterlab, exhibited at SPIE Photonics West 2024, held from Tuesday, January 30 to Thursday, February 1, 2024 at the Moscone Center in San Francisco, California, USA. The booth exhibited the thickness measurement sensor and surface shape measurement sensor products developed by Meterlab, and the R&D staff of Meterlab also participated in the exhibition. In particular, the thickness measurement sensor t-Nova-1550TN was introduced in a compact configuration at this exhibition.

Figure 1. Booth view

As shown in Figure 1, we exhibited in a table booth, with the compact thickness measurement sensor t-Nova-1550TN on the left side of the table, the three-dimensional surface shape measurement sensor t-Nova-850H using line spectroscopy on the right side, and product introduction videos and catalogs in the center. The banner introduces the four product families developed by Metrolab: s-Nova high-speed spectrometer, t-Nova thickness measurement sensor, s-Nova-H line spectrometer, and t-Nova-H surface topography measurement sensor.

Figure 2. t-Nova-850H and s-Nova spectrometers on the product introduction table.

On the left side of the table, as shown in Figure 3, the compact thickness measurement sensor t-Nova-1550TN was demonstrated for real-time thickness and refractive index measurement. On the right side of the table, the t-Nova-850H, a three-dimensional surface topography measurement sensor using a line spectrometer, was shown in real time measuring the surface topography of a single-order certified standard material.

Fig. 3. Customer consultation

Even though it was the first exhibition in the United States, there was a lot of interest in the t-Nova-H, a three-dimensional surface topography measuring instrument, and the t-Nova series of thickness measurement sensors, including their measurement principles and performance. Based on the feedback received during the exhibition, we will endeavor to create the world's best measurement sensors that customers want and need.