The conference of the Korean Society of Precision Engineering is a place where you can experience the technologies and measuring equipment that can measure the thickness and shape of various materials. It is a place for precision professionals and students from all over the world to participate and share technical information. Meter Lab exhibited t-Nova-SR, a thickness gauge that can measure thin films of semiconductor, display, and battery element coating films, and t-Nova-SDI, a thickness gauge that can measure substrates of various materials such as glass and silicon. In addition, by exhibiting the s-Nova series of spectrometers used as detectors for thickness gauges, we answered visitors' questions and provided suitable solutions.  

Figure 1. Young engineer's session

In addition to participating in the exhibition, Ahnheulbi, a member of Meter Lab, was invited to a session by a young engineer and gave a presentation on 'Development of an optical measurement system for three-dimensional shape measurement of micro TSVs' and had time to introduce technology to the participants. Meter Lab will continue to be a company that communicates with customers through participation in many events. thank you