본문 바로가기 주메뉴 바로가기

Products Non contact thickness sensor t-Nova-850/1550R
t-Nova-850/1550R

Thin film thickness measurement sensor

  • Compact and robust configuration for inline measurements
  • High speed measurement
  • Easy to use for various industrial applications
INQUIRY
+ 82-70-7122-2000
Online Inquiry



  • Measurement screen





  • Principle





  • Reflectance data






  • Reflectance data

Specification

Specifications
Wavelength range 750 nm - 950 nmㅤ/ㅤ1490 nm - 1610 nm
Thickness measurement resolution 10 nm (or 0.1 nm)
Thickness measurement range 400 nm - 1.2 mm / 2 μm - 3 mm
Maximum Measurement speed 250 kHz / 40 kHz
Measurement principles Spectral-domain inteterferometry, Spectroscopic reflectometry

Download

Catalogue
Detailed Product Information
Download
Drawing
Detailed Product Darwing and CAD file
Download
Manual
Downloadable product Manual
Download
SDK
Downloadable Product Software Development Kit
Download
Firmware
Download Latest Product Firmware
Download

상단으로