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$[Demonstration] Simultaneous Measurement of Thickness and Refractive Index$

Applications

[Demonstration] Simultaneous Measurement of Thickness and Refractive Index

2026.07.06
Applications

[Demonstration] Multilayer Thin-Film Thickness Measurement

2026.07.06
Applications

[Demonstration] Single-layered Thin-Film Thickness Measurement

2026.07.06
Applications

[Demonstration] Flexible Non-Uniform Film Thickness Measurement

2026.07.06
Applications

[Demonstration] Silicon Wafer Thickness Profile Measurement

2026.07.06
Applications

[Demonstration] OLED Thickness Distribution Measurement

2026.07.06
Applications

[Demonstration] High-Speed Thin-Film Thickness Distribution Measurement

2026.07.06
Applications

[Demonstration] Real-Time Distance Measurement

2026.07.06
Applications

Deep Learning-based Thickness Measurement for Rough-Surface Thin Films

2026.05.08
$Simultaneous Measurement of Thickness, Refractive Index, and 3D Shape of Silicon Wafers$

Applications

Simultaneous Measurement of Thickness, Refractive Index, and 3D Shape of Silicon Wafers

2026.05.08
Others

Technical Seminar on Advanced Measurement Technology at NMIJ/AIST

2026.04.27
Others

Invited Talk and Oral Presentations at OPIC-OPTM2026 International Conference

2026.04.27

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